The Influence of Grain Size Determination Method on Grain Growth Kinetics Analysis Academic Article

abstract

• The fullwidth at halfmaximum (FWHM), integral width (IntW), and Scherrer methodologies were used jointly with Xray diffraction (XRD) peak broadening and transmission electron microscopy (TEM) data to provide insight into the mechanisms that govern grain growth behavior in an Al 5083B4C nanocomposite. Grain growth kinetics were studied by fitting the appropriate grain size data from the three XRDbased methods to the wellknown Burke equation. Variations observed in the absolute grain sizes calculated from different methods were in agreement with previous studies. In spite of these variations, consistent grain growth trends were observed, which resulted in relatively similar Arrhenius plots indicating two grain growth regimes. Consequently, the applicability as well as any relevant uncertainties within each method are described and discussed.

authors

• Lavernia Borrego, Enrique
• Schoenung, Julie

published proceedings

• Advanced Engineering Materials

author list (cited authors)

• HashemiSadraei, L., Mousavi, S. E., Lavernia, E. J., & Schoenung, J. M.

complete list of authors

• Hashemi‐Sadraei, Leyla||Mousavi, S Ebrahim||Lavernia, Enrique J||Schoenung, Julie M

publication date

• November 2015

publisher

• Wiley  Publisher

published in

• Advanced Engineering Materials  Journal

keywords

• 40 Engineering
• 4005 Civil Engineering
• 4016 Materials Engineering
• 4017 Mechanical Engineering

Digital Object Identifier (DOI)

• 10.1002/adem.201500057

start page

• 1598

end page

• 1607

volume

• 17

issue

• 11

URL

• http://dx.doi.org/10.1002/adem.201500057