Fragmentation of the edge of a terminated Cu nanolayer within a Nb matrix upon annealing
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Sheu, E., Zhang, Y., Kim, H., Williams, D. J., Baldwin, J. K., & Demkowicz, M. J.
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Sheu, Emmeline||Zhang, Yifan||Kim, Hyosim||Williams, Darrick J||Baldwin, John Kevin||Demkowicz, Michael J
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40 Engineering
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4018 Nanotechnology
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