An on-chip spectrum analyzer for analog built-in testing Academic Article uri icon

abstract

  • This paper presents an analog built-in testing (BIT) architecture and its implementation. It enables the frequency response and harmonic distortion characterizations of an integrated device-under-test (DUT) through a digital off-chip interface. External analog instrumentation is avoided, reducing test time and cost. The proposed on-chip testing scheme uses a digital frequency synthesizer and a simple signal generator synchronized with a switched capacitor bandpass filter. A general methodology for the use of this structure in the functional verification of a DUT is also provided. The circuit-level design and experimental results of an integrated prototype in standard CMOS 0.5 m technology are presented to demonstrate the feasibility of the proposed BIT technique. 2005 Springer Science + Business Media, Inc.

published proceedings

  • JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

altmetric score

  • 3

author list (cited authors)

  • Mendez-Rivera, M. G., Valdes-Garcia, A., Silva-Martinez, J., & Sanchez-Sinencio, E.

citation count

  • 34

complete list of authors

  • M�ndez-Rivera, Marcia G||Valdes-Garcia, Alberto||Silva-Martinez, Jose||S�nchez-Sinencio, Edgar

publication date

  • June 2005