A CMOS RF RMS detector for built-in testing of wireless transceivers Conference Paper uri icon

abstract

  • A CMOS RF RMS detector is introduced. It generates a DC proportional to the RMS voltage amplitude of an RF signal. Its high input impedance and small silicon area make it suitable for the built-in testing (BIT) of critical RF blocks of a transceiver such as a Low Noise Amplifier (LNA) and Power Amplifier (PA) without affecting their performance and with minimum area overhead. The use of this structure in the fault detection and diagnosis of a wireless transceiver is described and illustrated with an example. The transistor-level implementation of the proposed circuit is discussed in detail. Post-layout simulation results using CMOS 0.35m technology show that this testing device is able to perform an RF to DC conversion at 2.4GHz in a dynamic range of 20dB using an area of only 0.0135mm2 and presenting an equivalent input capacitance of 22.5fF. 2005 IEEE.

name of conference

  • 23rd IEEE VLSI Test Symposium (VTS'05)

published proceedings

  • 23RD IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS

author list (cited authors)

  • Valdes-Garcia, A., Venkatasubramanian, R., Srinivasan, R., Silva-Martinez, J., & Sanchez-Sinencio, E. S.

citation count

  • 61

complete list of authors

  • Valdes-Garcia, A||Venkatasubramanian, R||Srinivasan, R||Silva-Martinez, J||Sanchez-Sinencio, ES

publication date

  • January 2005