An on-chip transfer function characterization system for analog built-in testing Conference Paper uri icon

abstract

  • A compact system for the on-chip transfer function characterization of an analog circuit is presented. It consists of a phase and amplitude detector and a signal generator. A general methodology for the use of this structure in the functional verification of a circuit under test (CUT) is provided. An integrated implementation of the proposed system in CMOS 0.35m technology is described along with circuit-level design considerations. Experimental results of the application of this system in the characterization of a commercial programmable gain amplifier for frequencies up to 160MHz are also presented.

name of conference

  • 22nd IEEE VLSI Test Symposium, 2004. Proceedings.

published proceedings

  • 22ND IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS

author list (cited authors)

  • Valdes-Garcia, A., Silva-Martinez, J., & Sanchez-Sinencio, E.

citation count

  • 6

complete list of authors

  • Valdes-Garcia, A||Silva-Martinez, J||Sanchez-Sinencio, E

publication date

  • January 2004