Gate dielectric material and process effects on distribution pattern of nano-resistors in solid-state incandescent light emitting devices
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Su, J. Q., Kuo, Y., & Liu, P.
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Su, Jia Quan||Kuo, Yue||Liu, Po-Tsun
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40 Engineering
4016 Materials Engineering
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http://dx.doi.org/10.1557/s43580-022-00276-5