Study of Thick Film Resistors By 1/f Noise Measurements Academic Article uri icon

abstract

  • Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.In this paper investigations based on temperature dependent 1/f noise measurements are reported.

published proceedings

  • Active and Passive Electronic Components

author list (cited authors)

  • Ambrózy, A., Hahn, E., Kiss, L. B., & Trefán, G.

citation count

  • 4

complete list of authors

  • Ambrózy, A||Hahn, E||Kiss, LB||Trefán, G

publication date

  • January 1989