Dynamic risk-based fault prediction of chemical processes using online sparse model identification Conference Paper

name of conference

• 2021 American Control Conference (ACC)

authors

• Kwon, Joseph

published proceedings

• 2021 AMERICAN CONTROL CONFERENCE (ACC)

author list (cited authors)

• Bhadriraju, B., Kwon, J., & Khan, F.

citation count

• 1

complete list of authors

• Bhadriraju, Bhavana||Kwon, Joseph Sang-Il||Khan, Faisal

publication date

• May 2021

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• Proceedings of the ... American Control Conference. American Control Conference  Journal

Digital Object Identifier (DOI)

• 10.23919/acc50511.2021.9482739

start page

• 4964

end page

• 4969

volume

• 00

URL

• http://dx.doi.org/10.23919/acc50511.2021.9482739