Design for Testability of Sleep Convention Logic
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Overview
published proceedings
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems
author list (cited authors)
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Parsan, F. A., Smith, S. C., & Al-Assadi, W. K.
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Parsan, Farhad A||Smith, Scott C||Al-Assadi, Waleed K
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40 Engineering
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4008 Electrical Engineering
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Sleep Research
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URL
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http://dx.doi.org/10.1109/tvlsi.2015.2419816