Critical area analysis Conference Paper

name of conference

• [1992] Proceedings International Conference on Wafer Scale Integration

authors

• Walker, Duncan

published proceedings

• [1992] Proceedings International Conference on Wafer Scale Integration

altmetric score

• 3

author list (cited authors)

• Walker, D.

citation count

• 13

complete list of authors

• Walker, DMH

publication date

• January 1992

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/icwsi.1992.171820

start page

• 281

end page

• 290

URL

• http://dx.doi.org/10.1109/icwsi.1992.171820