Estimation of reject ratio in testing of combinatorial circuits Conference Paper

name of conference

• Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium

authors

• Walker, Duncan

published proceedings

• Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium

author list (cited authors)

• Gaitonde, D. D., Khare, J., Walker, D., & Maly, W.

citation count

• 4

complete list of authors

• Gaitonde, DD||Khare, J||Walker, DMH||Maly, W

publication date

• January 1993

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/vtest.1993.313370

start page

• 319

end page

• 325

URL

• http://dx.doi.org/10.1109/vtest.1993.313370