Fading memory effects in a memristor for Cellular Nanoscale Network applications
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published proceedings
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PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
author list (cited authors)
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Ascoli, A., Tetzlaff, R., Chua, L. O., Strachan, J. P., & Williams, R. S.
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Ascoli, A||Tetzlaff, R||Chua, LO||Strachan, JP||Williams, RS
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