Fading memory effects in a memristor for Cellular Nanoscale Network applications Conference Paper uri icon

published proceedings

  • PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)

author list (cited authors)

  • Ascoli, A., Tetzlaff, R., Chua, L. O., Strachan, J. P., Williams, R. S., & IEEE.

complete list of authors

  • Ascoli, A||Tetzlaff, R||Chua, LO||Strachan, JP||Williams, RS

publication date

  • January 1, 2016 11:11 AM