Integrating Deep Learning and Explicit MPC for Advanced Process Control Conference Paper

name of conference

• 2020 American Control Conference (ACC)

authors

• Pistikopoulos, Stratos

published proceedings

• 2020 AMERICAN CONTROL CONFERENCE (ACC)

author list (cited authors)

• Katz, J., Pappas, I., Avraamidou, S., & Pistikopoulos, E. N.

citation count

• 8

complete list of authors

• Katz, Justin||Pappas, Iosif||Avraamidou, Styliani||Pistikopoulos, Efstratios N

publication date

• July 2020

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• Proceedings of the ... American Control Conference. American Control Conference  Journal

Digital Object Identifier (DOI)

• 10.23919/acc45564.2020.9147582

start page

• 3559

end page

• 3564

volume

• 00

URL

• http://dx.doi.org/10.23919/acc45564.2020.9147582