Time-Division- Multiplexed test delivery for NoC systems Academic Article

authors

• Mahapatra, Rabinarayan

published proceedings

• IEEE Design and Test

author list (cited authors)

• Nolen, J., & Mahapatra, R.

citation count

• 0

complete list of authors

• Nolen, John||Mahapatra, Rabi

publication date

• January 2007

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Design and Test  Journal

Digital Object Identifier (DOI)

• 10.1109/mdt.2007.4343580

start page

• x3

end page

• x3

volume

• 24

issue

• 99

URL

• http://dx.doi.org/10.1109/mdt.2007.4343580