Improved Fault Detection and Process Safety Using Multiscale Shewhart Charts. Academic Article uri icon

published proceedings

  • Journal of Chemical Engineering & Process Technology

author list (cited authors)

  • Sheriff, M. Z., & Nounou, M. N.

citation count

  • 3

complete list of authors

  • Sheriff, M Ziyan||Nounou, Mohamed N

publication date

  • January 2017