Bifurcation in deformation mechanism to overcome strength-ductility paradox in metal-ceramic multilayer thin-films Academic Article

abstract

• 2018 Author(s). Nanocrystalline multilayer thin-films are manufactured in configurations of alternating porous ceramic (TiN) layers of relatively high thickness (hceramic) with metal (Ti) layers of low thicknesses (0.8 nm < hmetal < 34 nm) and keeping a constant modulation ratio ( hceramic/hmetal 17.5). As hmetal decreases, the overall co-deformation mechanism in the multilayer films bifurcates into the dislocation dominant confined layer slip (CLS) mechanism in the metal and diffusional creep dominant processes in the porous ceramic layer at hmetal 6.7 nm. This bifurcation leads to simultaneously achieving the highest strain hardening rate due to the CLS mechanism in one layer and the highest strain rate sensitivity value due to the diffusional flow in the other and overcoming the strength-ductility paradox in multilayer thin-film materials at low temperatures.

authors

• Mansoor, Bilal

published proceedings

• APPLIED PHYSICS LETTERS

author list (cited authors)

• Mungole, T., Mansoor, B., Ayoub, G., & Field, D. P.

citation count

• 1

complete list of authors

• Mungole, Tarang||Mansoor, Bilal||Ayoub, Georges||Field, David P

publication date

• January 2018

publisher

• AIP Publishing  Publisher

published in

• Applied Physics Letters  Journal

Digital Object Identifier (DOI)

• 10.1063/1.5041344

start page

• 101902

end page

• 101902

volume

• 113

issue

• 10

URL

• http://dx.doi.org/10.1063/1.5041344