Deformation microstructure under microindents in single-crystal Cu using three-dimensional x-ray structural microscopy Academic Article uri icon


  • The use of three-dimensional x-ray structural microscopy for nondestructive investigations of the deformation microstructure under microindents was demonstrated. Point to point, micrometer-resolution x-ray microbeam measurements of local lattice rotations were made for selected positions under 100-mN Berkovich and conical indents in single-crystal copper. Local lattice orientation measurements were used to extract micrometer by micrometer lattice misorientations and rotation axes along x-ray microbeams. Measurements of the deformation microstructure in symmetry and off-symmetry geometries are reported and discussed in terms of their potential for fundamental deformation investigations.

published proceedings

  • Journal of Materials Research

author list (cited authors)

  • Yang, W., Larson, B. C., Pharr, G. M., Ice, G. E., Budai, J. D., Tischler, J. Z., & Liu, W.

citation count

  • 42

complete list of authors

  • Yang, Wenge||Larson, BC||Pharr, GM||Ice, GE||Budai, JD||Tischler, JZ||Liu, Wenjun

publication date

  • January 2004