A Built-In Self-Test and In Situ Analog Circuit Optimization Platform Academic Article uri icon

abstract

  • © 2004-2012 IEEE. In this paper, a built-in self-test and in situ analog circuit optimization platform is proposed and characterized. By integrating a fully digital optimization engine and self-test circuits along with circuits-under-optimization (CUO), this platform can automatically find an operating point that makes a good balance among multiple competing characteristic goals. Therefore, the arbitrary linear time-invariant CUO can be optimized even when there are large process-voltage-temperature variations and aging effects of devices. This platform is analyzed to determine the required accuracy of its building blocks in terms of noise and linearity. The feasibility of this platform is proved by a case study utilizing a Tow-Thomas bandpass biquad.

author list (cited authors)

  • Lee, S., Shi, C., Wang, J., Sanabria, A., Osman, H., Hu, J., & Sanchez-Sinencio, E.

citation count

  • 11

publication date

  • August 2018