ANODICALLY DOPED LAYERED BARRIER OXIDE FILMS: TUNGSTEN IN ALUMINA. Conference Paper

abstract

• In this paper results obtained as a result of using He**2** plus and Ar**4** plus MeV ion beams in a backscattering mode to probe the structure of anodic barrier alumina films grown in tungstate-containing borate buffer solutions are described. A periodic variation of tungsten in anodic films was observed. A possible mechanism for this possibly general phenomenon is proposed.

authors

• Schweikert, Emile

published proceedings

• Electrochemical Society Extended Abstracts

author list (cited authors)

• Murphy, O. J., Cocke, D. L., Kormali, S. M., Barros-Leite, C. V., Schweikert, E. A., Filpus Luyckx, P., Polansky, C., & Halverson, D. E.

complete list of authors

• Murphy, OJ||Cocke, DL||Kormali, SM||Barros-Leite, CV||Schweikert, EA||Filpus Luyckx, P||Polansky, C||Halverson, DE

publication date

• January 1985

published in

• Meeting Abstracts- Electrochemical Society -All Divisions-  Journal

start page

• 66

volume

• 85-1