IC performance prediction for test cost reduction Academic Article uri icon


  • © 1999 IEEE. This paper describes a methodology for building models predicting manufactured integrated circuit performances as a function of inline and wafer electrical test measurements. We show how these predictions can be used to predict the performance of an industrial microprocessor, and reduce the average number of speed bins that must be tested by 45%.

author list (cited authors)

  • Lee, J., Walker, D., Milor, L., Peng, Y., & Hill, G.

citation count

  • 12

publication date

  • January 1999