RUTHERFORD ION BACKSCATTERING STUDIES OF ANION DOPED ANODIC FILMS. Conference Paper

abstract

• Anodic films, including alumina, grown in the presence of various metal oxyanions have been found to have a layered structure with the 'anion' located in discrete layers in the oxide film. Quantitative RBS has been used to examine the films. RBS reveals that the anion rich layers are deficient in aluminum cations. The extent of this deficiency is a function of temperature. Although the mechanism of periodic anion incorporation has yet to be determined, several models are discussed in the context of presently available data.

authors

• Schweikert, Emile

published proceedings

• Proceedings - The Electrochemical Society

author list (cited authors)

• Cocke, D. L., Murphy, O. J., Kormali, S. M., Halverson, D. E., Schweikert, E. A., Baptista, G. B., Patnaik, B. K., & Barros Leite, C. V.

complete list of authors

• Cocke, DL||Murphy, OJ||Kormali, SM||Halverson, DE||Schweikert, EA||Baptista, GB||Patnaik, BK||Barros Leite, CV

publication date

• December 1986

published in

• Proceedings- Electrochemical Society Pv  Journal

start page

• 418

end page

• 428

volume

• 86-11