Analysis of the X-ray and time-resolved XUV emission of laser produced Xe and Kr plasmas
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abstract
A frequency-doubled laser beam of the Nd:glass kilojoule nanosecond LULI2000 facility (1.5 ns duration, 200-400 J energy, 0.53 m wavelength) was focused on a Xe or Kr gas jet. The plasma was simultaneously diagnosed with X-ray (in the wavelength range of 6-8 for Kr and of 12-15 for Xe) and time-resolved XUV (20-200 ) emission spectroscopy. Electron density and temperature as well as the ionization charge were measured by time-resolved Thomson scattering of the heating laser pulse. The spectra are compared with the calculations performed with the NLTE collisional-radiative code AVERROES/TRANSPEC. Best fits of the X-ray and XUV spectra obtained are presented. The measured charge distribution and dynamics is analyzed using the simultaneous Thomson scattering diagnostic. 2007 Elsevier B.V. All rights reserved.