X and time-resolved XUV emission of laser produced Xe and Kr plasmas
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X and XUV spectra of Xe and Kr were measured in a gas jet irradiated by a 400J energy, 1.5 ns duration laser pulse. Simultaneously, the plasma was diagnosed by electronic and ionic Thomson scattering. The XUV spectra were time-resolved with a differentially pumped streak camera. Experimental spectra are compared with simulations performed with a NLTE atomic physics model. EDP Sciences.