Current-voltage and low-frequency noise characteristics of structures with porous silicon layers exposed to different gases Academic Article uri icon

abstract

  • Current-voltage and noise characteristics of porous silicon (PS)/single crystalline silicon (SCS) samples were measured under exposure to dry air, air +0.4% CO, dry air +1.7% CO, and dry air+ethyl alcohol vapor. The samples have a sandwich structure comprising Al/PS/SCS/Al. For the dry air +CO mixtures, the noise level was sensitive not only to the presence of CO but also to its percentage, and an increase of the CO concentration led to a change in the spectral density function of the low-frequency noise. 2007 Elsevier B.V. All rights reserved.

published proceedings

  • PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES

author list (cited authors)

  • Mkhitaryan, Z. H., Shatveryan, A. A., Aroutiounian, V. M., Ghulinyan, M., Pavesi, L., Kish, L. B., & Granqvist, C. G.

citation count

  • 9

complete list of authors

  • Mkhitaryan, ZH||Shatveryan, AA||Aroutiounian, VM||Ghulinyan, M||Pavesi, L||Kish, LB||Granqvist, CG

publication date

  • January 2007