Biased percolation approach to failure propagation in nanostructures and prediction of the total failure by electronic noise analysis Conference Paper uri icon

abstract

  • The analysis of electronic noise has the potential to predict forthcoming catastrophic failure of electronic devices and integrated circuits. This has a particularly important potential in submicron and nanoelectronics.

name of conference

  • Nanoscale Optics and Applications

published proceedings

  • NANOSCALE OPTICS AND APPLICATIONS

author list (cited authors)

  • Kish, L. B., Pennetta, C., & Gingl, Z.

citation count

  • 0

complete list of authors

  • Kish, LB||Pennetta, C||Gingl, Z

editor list (cited editors)

  • Cao, G., & Kirk, W. P.

publication date

  • January 2002