Built-In Current Sensor for IDDQ Test Conference Paper

abstract

• A practical Built-in Current Sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 A. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration circuit, the sensor can maintain its accuracy and achieve a clock rate of over 1 GHz, for a measurement time of a few milliseconds. 2004 IEEE.

name of conference

• Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004)

authors

• Walker, Duncan

published proceedings

• DBT 2004: PROCEEDINGS OF THE 2004 IEEE INTERNATIONAL WORKSHOP ON CURRENT & DEFECT BASED TESTING
• Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004)

author list (cited authors)

• Xue, B., & Walker, D.

citation count

• 18

complete list of authors

• Xue, B||Walker, DMH

publication date

• January 2004

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/dbt.2004.1408945

International Standard Book Number (ISBN) 10

• 0-7803-8950-6
• 0780389506

International Standard Book Number (ISBN) 13

• 9780780389502

start page

• 3

end page

• 9

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Fdbt.2004.1408945