Built-In Current Sensor for IDDQ Test Conference Paper uri icon


  • A practical Built-in Current Sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 μA. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration circuit, the sensor can maintain its accuracy and achieve a clock rate of over 1 GHz, for a measurement time of a few milliseconds. © 2004 IEEE.

author list (cited authors)

  • Xue, B., & Walker, D.

citation count

  • 17

publication date

  • January 2004