Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic Devices Academic Article

abstract

• This study develops a full Bayesian approach to analysing hazard rate, change point, and cost-optimal burn-in time for electronic devices. The Weibull-exponential distribution is used to model the L-shaped hazard rate function that is commonly observed for electronic devices. The optimal burn-in time is selected to minimize the prior or posterior total expected costs, which explicitly consider the uncertainties on all the model parameters. The proposed approach is illustrated using an experimental data set consisting of failure times of a nano-scale high-k gate dielectric film. 2010 IEEE.

authors

• Kuo, Yue

published proceedings

• IEEE TRANSACTIONS ON RELIABILITY

author list (cited authors)

• Yuan, T., & Kuo, Y.

citation count

• 25

complete list of authors

• Yuan, Tao||Kuo, Yue

publication date

• March 2010

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• n0018-9529ISSN  Journal

keywords

• Bayesian Analysis
• Change Point
• Optimal Burn-in
• Time-dependent Dielectric Breakdown
• Weibull-exponential Distribution

Digital Object Identifier (DOI)

• 10.1109/TR.2010.2040776

start page

• 132

end page

• 138

volume

• 59

issue

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1109%2Ftr.2010.2040776