n159184SE Academic Article uri icon

abstract

  • We introduce the new technique of evanescent-wave cavity ring-down ellipsometry (EW-CRDE), used for the measurement of ellipsometric angles of samples at a solid-gas or solid-liquid interface, and achieve phase-shift measurements with precision of 0.01. We demonstrate the technique by measuring the time-dependent refractive index of methanol-water mixtures and thin films at the liquid/fused-silica interface, showing that the monitoring of monolayers on microsecond time scales using EW-CRDE should be achievable.

published proceedings

  • J Phys Chem Lett

author list (cited authors)

  • Everest, M. A., Papadakis, V. M., Stamataki, K., Tzortzakis, S., Loppinet, B., & Rakitzis, T. P.

publication date

  • January 1, 2011 11:11 AM