We introduce the new technique of evanescent-wave cavity ring-down ellipsometry (EW-CRDE), used for the measurement of ellipsometric angles of samples at a solid-gas or solid-liquid interface, and achieve phase-shift measurements with precision of 0.01. We demonstrate the technique by measuring the time-dependent refractive index of methanol-water mixtures and thin films at the liquid/fused-silica interface, showing that the monitoring of monolayers on microsecond time scales using EW-CRDE should be achievable.
published proceedings
J Phys Chem Lett
author list (cited authors)
Everest, M. A., Papadakis, V. M., Stamataki, K., Tzortzakis, S., Loppinet, B., & Rakitzis, T. P.
citation count
6
complete list of authors
Everest, Michael A||Papadakis, Vassilis M||Stamataki, Katerina||Tzortzakis, Stelios||Loppinet, Benoit||Rakitzis, T Peter
