Interference-based probe of the nano-scale topography of microparticles Conference Paper

abstract

• Measuring nano-scale topography of microparticles is important in microfluidic-based manufacturing settings, but high-throughput characterization could be hindered by the complex instrumentation required. Conversely, reflection interference contrast microscopy (RICM) requires a fairly simple set-up, offers high spatial/temporal resolution, and provides images embedding accurate topographic information of microscopic objects. Here we present an approach to retrieve statistics of an object's nano-scale surface topography from RICM images and illustrate its use on microspheres.

authors

• Jayaraman, Arul
• Ugaz, Victor

published proceedings

• 20th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2016

author list (cited authors)

• Contreras-Naranjo, J. C., Chang, J., Jayaraman, A., & Ugaz, V. M.

complete list of authors

• Contreras-Naranjo, JC||Chang, J||Jayaraman, A||Ugaz, VM

publication date

• January 2016

International Standard Book Number (ISBN) 13

• 9780979806490

start page

• 1352

end page

• 1353