Degradation of Commercially Available DAC ICs in a Mixed-Radiation Environment Conference Paper

abstract

• 2003 IEEE. Experiments were performed at several fluence levels in a mixed-radiation environment (fast neurons and gamma rays) to better understand electrical performance of digital to analog converters under irradiation. Procedures, facilities and results are presented.

name of conference

• 2003 IEEE Radiation Effects Data Workshop

authors

• Fink, Rainer
• Porter, Jay

published proceedings

• 2003 IEEE Radiation Effects Data Workshop

author list (cited authors)

• Aghara, S., Fink, R. J., Charlton, W. S., Bhuva, B., Samadi, M. R., Ochoa, J. A., & Porter, J. R.

citation count

• 1

complete list of authors

• Aghara, S||Fink, RJ||Charlton, WS||Bhuva, B||Samadi, MR||Ochoa, JA||Porter, JR

publication date

• January 2003

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

Digital Object Identifier (DOI)

• 10.1109/redw.2003.1281318

International Standard Book Number (ISBN) 10

• 0780381270

start page

• 34

end page

• 37

volume

• 2003-January