Degradation of commercially available DAC ICs in a mixed-radiation environment Conference Paper uri icon

abstract

  • 2003 IEEE. Experiments were performed at several fluence levels in a mixed-radiation environment (fast neurons and gamma rays) to better understand electrical performance of digital to analog converters under irradiation. Procedures, facilities and results are presented.

name of conference

  • 2003 IEEE Radiation Effects Data Workshop

published proceedings

  • 2003 IEEE Radiation Effects Data Workshop

author list (cited authors)

  • Aghara, S., Fink, R. J., Charlton, W. S., Bhuva, B., Samadi, M. R., Ochoa, J. A., & Porter, J. R

publication date

  • January 1, 2003 11:11 AM

publisher