Multiplicity analysis: a study of secondary particle distribution and correlation Academic Article uri icon

abstract

  • A statistical treatment of the number of secondary electrons, ions or neutrals emitted as a consequence of projectile-solid collision is described. The multiplicity distribution of the ejected particles and their correlation coefficients Q are defined and discussed. A random emission model is analyzed analytically and some of its predictions are compared with Monte Carlo simulations. This treatment provides basic grounds for coincidence counting analysis. It is shown that the secondary ion emission of certain systems is strongly correlated, thus providing information about their desorption mechanism. Background material in statistics and the Monte Carlo algorithm used are presented in Appendices A-D. 1998 Elsevier Science B.V. All rights reserved.

published proceedings

  • SURFACE SCIENCE

author list (cited authors)

  • da Silveira, E. F., Duarte, S. B., & Schweikert, E. A.

citation count

  • 12

complete list of authors

  • da Silveira, EF||Duarte, SB||Schweikert, EA

publication date

  • June 1998