Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts. Conference Paper

abstract

• The use of large cluster primary ions (e.g. C60, Au400) in secondary ion mass spectrometry has become prevalent in recent years due to their enhanced emission of secondary ions, in particular, molecular ions (MW 1500 Da). The co-emission of electrons with SIs was investigated per projectile impact. It has been found that SI and electrons yields increased with increasing projectile energy and size. The use of the emitted electrons from impacts of C60 for localization has been demonstrated for cholesterol deposited on a copper grid. The instrumentation, methodologies, and results from these experiments are presented.

authors

• Schweikert, Emile

published proceedings

• Surf Interface Anal

author list (cited authors)

• Eller, M. J., Verkhoturov, S. V., Fernandez-Lima, F. A., Debord, J. D., Schweikert, E. A., & Della-Negra, S.

citation count

• 1

complete list of authors

• Eller, MJ||Verkhoturov, SV||Fernandez-Lima, FA||Debord, JD||Schweikert, EA||Della-Negra, S

publication date

• January 2013

publisher

• Wiley  Publisher

published in

• Surface and Interface Analysis  Journal

keywords

• Cluster Sims
• Electron Emission
• Electron Emission Microscope
• LOCALIZATION

PubMed Central ID

• 24163488

Digital Object Identifier (DOI)

• 10.1002/sia.4949

start page

• 529

end page

• 531

volume

• 45

issue

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1002%2Fsia.4949