Electron Emission From Hypervelocity C-60 impacts Academic Article

abstract

• Secondary ion mass spectrometry (SIMS) performed in the event-by-event bombardment detection mode when coupled to an electron emission microscope allows one to investigate individual nano-objects. Two groups of Au and Al oxide nano-objects were compared with their bulk counterparts based on their secondary ion and electron emission from individual C60 impacts at 15 and 30 keV total impact energy. Our results show that electron yields depend on the size and surroundings of the nano-object, and at higher impact energies, these differences in electron emission are more pronounced. A second key observation for systems of similar chemical makeup but different surface topography and size is that the emission of secondary ions and electrons is independent of each other. 2010 American Chemical Society.

authors

• Schweikert, Emile

published proceedings

• JOURNAL OF PHYSICAL CHEMISTRY C

author list (cited authors)

• Eller, M. J., Verkhoturov, S. V., Della-Negra, S., & Schweikert, E. A.

citation count

• 6

complete list of authors

• Eller, MJ||Verkhoturov, SV||Della-Negra, S||Schweikert, EA

publication date

• October 2010

publisher

• American Chemical Society (ACS)  Publisher

published in

• Journal of Physical Chemistry C  Journal

keywords

• 34 Chemical Sciences
• 3406 Physical Chemistry
• Bioengineering
• Nanotechnology

Digital Object Identifier (DOI)

• 10.1021/jp104027q

start page

• 17191

end page

• 17196

volume

• 114

issue

• 40

URL

• http%3A%2F%2Fdx.doi.org%2F10.1021%2Fjp104027q