Multiple secondary ion emission from keV massive gold projectile impacts Academic Article

abstract

• We present the first experimental data on secondary ion emission characteristics from the impact of 26 keV Au3+ and 74.6-114.6 keV Au4004+. In particular we show secondary ion yield distributions and secondary ion and coincidental ion yields of molecular cluster ions from single impact events. The target consisted of an amorphous (HfO2)0.6(SiO2)0.4 layer deposited on a Si wafer. Large increases in higher order emission events and both secondary ion and coincidental ion yields within these events were observed for bombardment with Au4004+ even though the energy per atom of this projectile is more than an order of magnitude less than Au 3+. 2004 Elsevier B.V. All rights reserved.

authors

• Schweikert, Emile

published proceedings

• INTERNATIONAL JOURNAL OF MASS SPECTROMETRY

author list (cited authors)

• Verkhoturov, S. V., Hager, G. J., Schweikert, E. A., & Bennett, J. A.

citation count

• 17

complete list of authors

• Verkhoturov, SV||Hager, GJ||Schweikert, EA||Bennett, JA

publication date

• February 2005

publisher

• Elsevier  Publisher

published in

• International Journal of Mass Spectrometry  Journal

keywords

• Coincidental Ion Yield
• Gold Projectile Impacts
• Secondary Ion Emission
• Yield Distributions

Digital Object Identifier (DOI)

• 10.1016/j.ijms.2004.10.009

start page

• 57

end page

• 61

volume

• 241

issue

• 1

URL

• http%3A%2F%2Fdx.doi.org%2F10.1016%2Fj.ijms.2004.10.009