Secondary ion yield improvements for phosphated and sulfated molecules using substrate-enhanced time-of-flight secondary ion mass spectrometry Academic Article uri icon

published proceedings

  • INTERNATIONAL JOURNAL OF MASS SPECTROMETRY

author list (cited authors)

  • English, R. D., Van Stipdonk, M. J., & Schweikert, E. A.

citation count

  • 4

complete list of authors

  • English, RD||Van Stipdonk, MJ||Schweikert, EA

publication date

  • September 2001