Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry Conference Paper

abstract

• We demonstrate the capability of cluster secondary ion mass spectrometry on characterization of multi-layer ultrathin films assembled by electrostatic adsorption of oppositely charged polyelectrolytes. The samples consisting of layers of polyethylenimine, PEI, and polystyrene sulfonate, PSS, were bombarded with 19keV (CsI)Cs + and 21keV Au 3+ projectiles with secondary ions identified by time-of-flight mass spectrometry. The data show the high sensitivity of cluster SIMS to the physico-chemical characteristics of the two topmost layers. 2004 Elsevier B.V. All rights reserved.

authors

• Schweikert, Emile

published proceedings

• APPLIED SURFACE SCIENCE

author list (cited authors)

• Li, Z., Rickman, R. D., Verkhoturov, S. V., & Schweikert, E. A.

citation count

• 8

complete list of authors

• Li, Z||Rickman, RD||Verkhoturov, SV||Schweikert, EA

publication date

• June 2004

publisher

• Elsevier  Publisher

published in

• Applied Surface Science  Journal

keywords

• Layer-by-layer
• Polyelectrolytes
• Self-assembly
• Sims

Digital Object Identifier (DOI)

• 10.1016/j.apsusc.2004.03.081

start page

• 328

end page

• 331

volume

• 231

URL

• http%3A%2F%2Fdx.doi.org%2F10.1016%2Fj.apsusc.2004.03.081