MICRO AND SURFACE-ANALYSIS WITH FAST HEAVY-IONS Academic Article uri icon

abstract

  • The desorption of atomic and molecular species from surfaces bombarded by fast heavy ions (Z 20; E 0.5 MeV/amu) is attractive for surface and microscopic characterization. Only a low-intensity probe beam is needed, the escape depth of desorbed species is shallow (ca. 10 ), and desorbed ions are efficiently detected with a time-of-flight mass spectrometer. Thus, particle-induced desorption mass spectrometry (PDMS) maintains sample integrity and charging effects are avoided. PDMS is useful for surface analysis of glasses and plastics by using californium-252 fission fragments for bombardment. Inorganic and organic surface constituents can be detected simultaneously; mass resolution is good. For lithium in glass, the detection limit is about 1 pg (ca. 100 g g-1. The PDMS technique can be combined with sequential ion etching for depth profiling. The feasibility of PDMS for microscopic analysis with a collimated 84-MeV Kr7+ beam (target diameter ca. 11 m) is discussed. 1987.

published proceedings

  • ANALYTICA CHIMICA ACTA

author list (cited authors)

  • SCHWEIKERT, E. A., SUMMERS, W. R., BEUGDEEB, M., FILPUSLUYCKX, P. E., & QUINONES, L.

citation count

  • 8

complete list of authors

  • SCHWEIKERT, EA||SUMMERS, WR||BEUGDEEB, MUD||FILPUSLUYCKX, PE||QUINONES, L

publication date

  • January 1987