A comparison of SIMS and PDMS: Analyses of mixed metal oxides
- Additional Document Info
- View All
Cf-252 PDMS and dynamic SIMS analyses of the class of mixed metal oxides known as ferrites (CuFe2O4, CoFe2O4, and NiFe2O4 were performed. This study provides a direct comparison of the two surface science techniques. The results yielded information in the following three areas: 1. (1) the ability to detect surface contamination, 2. (2) the differences in spectral response, and 3. (3) electronic and geometric structural information via the charge state and resulting cluster ions that were formed. Normal dynamic SIMS provides more information on the clusters in the higher mass region due to the nature of its 'harder' ionization process. PDMS is more sensitive to the outer surface layers and the elements and processes (i.e. cationization) that have or arise due to lower ionization potentials. The two techniques provide complementary information, and both are highly suggested for a more complete surface analysis. © 1988.
author list (cited authors)
Mcafee, C. D., Perry, E. M., Schweikert, E. A., & Cocke, D. L.