APPLICATION OF CHARGED-PARTICLE ACTIVATION-ANALYSIS TO TRACE CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS
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Overview
published proceedings
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JOURNAL OF RADIOANALYTICAL CHEMISTRY
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SCHWEIKERT, E. A., MCGINLEY, J. R., FRANCIS, G., & SWINDLE, D. L.
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SCHWEIKERT, EA||MCGINLEY, JR||FRANCIS, G||SWINDLE, DL
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34 Chemical Sciences
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3401 Analytical Chemistry
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3402 Inorganic Chemistry
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http%3A%2F%2Fdx.doi.org%2F10.1007%2Fbf02515270