Characterization of individual nano-objects with nanoprojectile-SIMS. Conference Paper uri icon

abstract

  • Secondary ion mass spectrometry (SIMS) applied in the event-by-event bombardment/detection mode is uniquely suited for the characterization of individual nano-objects. In this approach, nano-objects are examined one-by-one, allowing for the detection of variations in composition. The validity of the analysis depends upon the ability to physically isolate the nano-objects on a chemically inert support. This requirement can be realized by deposition of the nano-objects on a Nano-Assisted Laser Desorption/Ionization (NALDI) plate. The featured nanostructured surface provides a support where nano-objects can be isolated if the deposition is performed at a proper concentration. We demonstrate the characterization of individual nano-objects on a NALDI plate for two different types of nanometric bacteriophages: Q and M13. Scanning electron microscope (SEM) images verified that the integrity of the phages is preserved on the NALDI substrate. Mass spectrometric data show secondary ions from the phages are identified and resolved from those from the underlying substrate.

published proceedings

  • Surf Interface Anal

author list (cited authors)

  • Liang, C., Verkhoturov, S. V., Bisrat, Y., Dikler, S., Debord, J. D., Fernandez-Lima, F. A., Schweikert, E. A., & Della-Negra, S.

citation count

  • 3

complete list of authors

  • Liang, C-K||Verkhoturov, SV||Bisrat, Y||Dikler, S||Debord, JD||Fernandez-Lima, FA||Schweikert, EA||Della-Negra, S

publication date

  • January 2013

publisher