COINCIDENCE COUNTING ANALYSIS OF SECONDARY IONS EMITTED FROM A PHENYLALANINE TARGET UNDER MULTICHARGED MEV CARBON BOMBARDMENT Academic Article

abstract

• Coincidence counting techniques for time-of-flight mass spectrometry have been applied to the study of secondary ion correlations. Phenylalanine samples were exposed to 2.5 MeV carbon ions with charge states ranging from +1 to +6. The influences of the projectile charge state on secondary ion yields and correlations are reported. The degree of secondary ion correlation was observed to decrease as the charge state of the primary ion increases. For the cases studied, the data indicate that more inefficient projectiles are better suited for monitoring secondary ion correlations. 1994.

authors

• Schweikert, Emile

published proceedings

• INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES

author list (cited authors)

• RAY, K. B., DASILVEIRA, E. F., JERONYMO, J., BAPTISTA, G. B., LEITE, C., & SCHWEIKERT, E. A.

citation count

• 3

complete list of authors

• RAY, KB||DASILVEIRA, EF||JERONYMO, JMF||BAPTISTA, GB||LEITE, CVB||SCHWEIKERT, EA

publication date

• September 1994

publisher

• Elsevier  Publisher

published in

• International Journal of Mass Spectrometry and Ion Processes  Journal

keywords

• Coincidence Counting
• Correlated Ion Emission
• Ion Desorption

Digital Object Identifier (DOI)

• 10.1016/0168-1176(94)04045-1

start page

• 107

end page

• 117

volume

• 136

issue

• 2-3

URL

• http%3A%2F%2Fdx.doi.org%2F10.1016%2F0168-1176%2894%2904045-1