X-RAY PHOTOELECTRON-SPECTROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY STUDY OF ANION INCORPORATION IN ANODICALLY GROWN FILMS Academic Article uri icon

abstract

  • Anodic oxide films on titanium and zirconium were grown in the presence of sodium tungstate. The surface and bulk characteristics of these films have been analyzed by X-ray photoelectron spectroscopy (XPS) and Rutherford backscattering spectrometry (RBS) as a function of terminal voltage and temperature. XPS results show a close association between the sodium and tungsten incorporated from the forming solution at the film surface. The RBS data reveal the existence of the tungsten species in a layered structure. These layers are distributed at regularly spaced intervals beneath the surface. The results are discussed in terms of a periodic precipitation reaction, also known as the Liesegang phenomenon. 1988.

published proceedings

  • THIN SOLID FILMS

author list (cited authors)

  • MAGNUSSEN, N., QUINONES, L., COCKE, D. L., SCHWEIKERT, E. A., PATNAIK, B. K., LEITE, C., & BAPTISTA, G. B.

citation count

  • 5

complete list of authors

  • MAGNUSSEN, N||QUINONES, L||COCKE, DL||SCHWEIKERT, EA||PATNAIK, BK||LEITE, CVB||BAPTISTA, GB

publication date

  • December 1988