A coincidence counting study of polyatomic ion induced sputtering
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Coincidence counting methods were used to examine the desorption of secondary ions from a CsI surface via keV atomic and polyatomic projectile impacts. A correlation between the emission of I- and CsI 2- secondary ions was attributed to the common chemical origin of the ions. The degree to which I- and CsI2- were correlated was observed to change as a function of the kinetic energy and complexity of the primary ion as well as the yield of I-. This is attributed to a change in the relative importance of competing ion formation processes as a function of the energy in the desorption site. © 1992 American Institute of Physics.
author list (cited authors)
Park, M. A., Cox, B. D., & Schweikert, E. A.