A COINCIDENCE COUNTING STUDY OF POLYATOMIC ION INDUCED SPUTTERING Academic Article

abstract

• Coincidence counting methods were used to examine the desorption of secondary ions from a CsI surface via keV atomic and polyatomic projectile impacts. A correlation between the emission of I and CsI2 secondary ions was attributed to the common chemical origin of the ions. The degree to which I and CsI2 were correlated was observed to change as a function of the kinetic energy and complexity of the primary ion as well as the yield of I. This is attributed to a change in the relative importance of competing ion formation processes as a function of the energy in the desorption site.

authors

• Schweikert, Emile

published proceedings

• JOURNAL OF CHEMICAL PHYSICS

author list (cited authors)

• PARK, M. A., COX, B. D., & SCHWEIKERT, E. A.

citation count

• 10

complete list of authors

• PARK, MA||COX, BD||SCHWEIKERT, EA

publication date

• June 1992

publisher

• AIP Publishing  Publisher

published in

• Journal of Chemical Physics  Journal

keywords

• 34 Chemical Sciences
• 3406 Physical Chemistry
• 51 Physical Sciences
• 5110 Synchrotrons And Accelerators

Digital Object Identifier (DOI)

• 10.1063/1.462321

start page

• 8171

end page

• 8176

volume

• 96

issue

• 11

URL

• http://dx.doi.org/10.1063/1.462321