SURFACE-STRUCTURE INVESTIGATIONS USING PLASMA DESORPTION MASS-SPECTROMETRY AND COINCIDENCE COUNTING Academic Article

abstract

• Coincidence counting techniques were used to study the plasma desorption of ions from a polycrystalline sample of Zirconium bis(monohydrogen orthophosphate)monohydrate (ZrP). Using coincidence counting in conjunction with time-of-flight (TOF) mass analysis, it was possible to obtain secondary ion spectra with a signal to background ratio a factor of ten better conventional TOF alone. It also was possible to produce a spectrum of SI that were desorbed in coincidence with PO-3 (characteristic of the ZrP). Cluster ions observed in this spectrum are related to the ZrP crystal structure. This supports a direct emission process for cluster ion production and demonstrates the utility of particle induced desorption in the determination of surface and crystal structure. 1993.

authors

• Clearfield, Abraham
• Schweikert, Emile

published proceedings

• INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES

author list (cited authors)

• VANSTIPDONK, M., PARK, M. A., SCHWEIKERT, E. A., SYLVESTER, P., & CLEARFIELD, A.

citation count

• 16

complete list of authors

• VANSTIPDONK, M||PARK, MA||SCHWEIKERT, EA||SYLVESTER, P||CLEARFIELD, A

publication date

• October 1993

publisher

• Elsevier  Publisher

published in

• International Journal of Mass Spectrometry and Ion Processes  Journal

keywords

• Coincidence Counting
• Plasma Desorption
• Surface Structure

Digital Object Identifier (DOI)

• 10.1016/0168-1176(93)87061-V

start page

• 133

end page

• 141

volume

• 128

issue

• 3

URL

• http%3A%2F%2Fdx.doi.org%2F10.1016%2F0168-1176%2893%2987061-v