An Atomic Force Microscopy Study of the Surface Morphology of Hyperbranched Poly(acrylic acid) Thin Films
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abstract
The surface morphology and topography of hyperbranched polyacrylic acid (PAA) films were investigated by atomic force microscopy as a function of film thickness, chemical functionalization and supporting substrate roughness. Results showed that hyperbranched PAA roughness varied as a function of the number of grafted PAA layers. On the initially rough Si/Ti substrates, the first three generations of PAA decreased the surface roughness. On very smooth single-crystal Au(111) surfaces, the films became progressively rougher starting from the first stage.