Kim, Jong Un (2003-05). Error rate and power dissipation in nano-logic devices. Master's Thesis. Thesis uri icon


  • Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation current are derived when a current-controlled logic processor works without error. An available operation range in a current-controlled processor with 100 million elements is discussed. The dependence of an error-free condition on temperature in single electron logic processors is derived. The size of the quantum dot of single electron transistor is predicted when a single electron logic processor with the a billion single electron transistors works without error at room temperature.

publication date

  • May 2003