Exploring the Possibilities of Combining Facial Expression and EEG in Acquaintance Test and Concealed Information Test (CIT) Conference Paper uri icon

name of conference

  • 43th Annual International Conference of the IEEE Engineering in Medicine and Biology Society

author list (cited authors)

  • Kim, C., Kim, T., & Yim, M.

complete list of authors

  • Kim, ChulMin||Kim, TaeRyun||Yim, Mansung