Slow Light Imaging Spectroscopy: Sensitivity of the Instrument Function to Optical Thickness and Gate Delay
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Abbasszadehrad, A., Meyers, J. M., Brown, K., Bak, J., Creel, J. R., Dogariu, A., & Miles, R.
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Abbasszadehrad, Amirhossein||Meyers, Jason M||Brown, Kevin||Bak, Junhwi||Creel, James R||Dogariu, Arthur||Miles, Richard
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http://dx.doi.org/10.2514/6.2024-0807