Digital-Twin-Based Diagnosis and Tolerant Control of T-Type Three-Level Rectifiers Academic Article

authors

• Abu-Rub, Haitham

published proceedings

• IEEE OPEN JOURNAL OF THE INDUSTRIAL ELECTRONICS SOCIETY

author list (cited authors)

• Sharida, A., Kamal, N. F., Alnuweiri, H., Bayhan, S., & Abu-Rub, H.

complete list of authors

• Sharida, Ali||Kamal, Naheel Faisal||Alnuweiri, Hussein||Bayhan, Sertac||Abu-Rub, Haitham

publication date

• 2023

publisher

• Institute of Electrical and Electronics Engineers (IEEE)  Publisher

published in

• IEEE Open Journal of the Industrial Electronics Society  Journal

keywords

• Digital Twin (dt)
• Fault-tolerant Control
• Open-switch Fault Detection
• Sensor Fault Detection
• Sensorless Control

Digital Object Identifier (DOI)

• 10.1109/OJIES.2023.3290169

start page

• 230

end page

• 241

volume

• 4

URL

• http://dx.doi.org/10.1109/ojies.2023.3290169