A high reliability network for ATM switching Conference Paper

authors

• Lu, Mi

published proceedings

• Proc. of the International Workshop on Computer-Aided Design, Test, and Evaluation for Dependability

author list (cited authors)

• Liao, Y., Chiang, C. T., & Lu, M. i.

complete list of authors

• Liao, Y||Chiang, CT||Lu, Mi

publication date

• July 1996

start page

• 214

end page

• 216